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    • 专利摘要:
    The present invention relates to a machine for automatically inspecting individual objects (2) traveling in flow (F) on a conveying plane (3) comprising at least one lighting station (4) and at least one detection station ( 4 ') under which the flow (F) to be inspected passes, the or each lighting station (4) comprising means (6) for applying and focusing radiation (R) inspection defining a lighting zone cross-sectional focus (ZEF), and the or each detection station (4 ') comprising, on the one hand, means (9) defining a cross-sectional detection zone (ZD) having a dimension (L) and on the other hand, means (9, 11) for collecting and transmitting the signal contained in a pixel (10) scanning the zone (ZD). Machine (1) characterized in that the focused illumination area (ZEF) is contained in the detection zone (ZD) over the entire width (L).
    公开号:FR3048369A1
    申请号:FR1651728
    申请日:2016-03-01
    公开日:2017-09-08
    发明作者:Antoine Bourely
    申请人:Pellenc Selective Technologies SA；
    IPC主号:
    专利说明:

    DESCRIPTION
    The present invention relates to the field of automatic characterization, and possibly the classification, sorting, evaluation or identification of objects or articles, or parts thereof, scrolling in flow, in form individual and separate elements or a product in one piece moving on a conveyor plane. Non-destructive characterization is carried out by analyzing light radiation reflected by objects, articles or products subjected to corresponding incidental radiation. An advantageous, but not limiting, application of this type of technology called "optical sorting" is the sorting of household, collective or industrial waste, in particular of recyclable household packaging.
    In this context, the invention provides an improved machine and inspection method for performing an automatic characterization.
    Many embodiments of machines and optical sorting processes are already known, marketed and implemented.
    With regard first of all to the nature of the incident or inspection radiation used, it should be noted that the technology considered and implemented is based on the emission of non-coherent and broad-spectrum radiation. Therefore, the machines and systems considered in the state of the art all use tungsten-halogen type thermal lighting sources, more simply called "halogens", and not lasers or light-emitting diodes. Halogens have a controlled spectral composition, which depends only on the color temperature, and their spectrum well covers the main areas of optical sorting: from 400 nm to 2500 nm. Other systems, and in particular lasers, allow excellent control of lighting geometry, but they are significantly more expensive and more complex to control, making them rarely used for optical sorting.
    In an optical sorter, the detection and illumination members are normally located at significant distances from the flows to be sorted, from 300 mm to 2000 mm. Indeed, the experiment shows that 300 mm is the necessary height of the corridor of passage of a waste stream to be sorted, if one wants to avoid the risks of jamming (jamming of objects in the machine, which triggers a blocking alert and a sorting stop). As for the large dimensions (up to 2,000 nun), they correspond to the need to scan with a single device a large conveyor width.
    The concept of optical balance is important to ensure a good signal-to-noise ratio, and therefore a good real-time detection.
    To improve the balance sheet, an obvious solution may be to maximize the proportion of emitted photons that are actually used for detection, what might be called "photon efficiency".
    In this perspective, it is the coincidence of detection zones and lighting zones that appears as the optimal solution: all the photons captured from the lighting line are collected and used by the sensors, and the sensors themselves. are used on their entire surface.
    However, most known systems do not approach such a coincidence, particularly because of the difficulty of its practical implementation, given manufacturing and use tolerances in particular. The traditional architecture of known optical sorters uses diffuse lighting having a large angle with the detection plane. They are very useful because they are easy to make and have a good variety of orientations for lighting objects, which is favorable.
    However, they are confronted with the problem of the depth of field, to be able to analyze objects of a certain thickness. They must therefore illuminate not only the detection line at the carpet, but also all the detection lines located in the detection plane and above the carpet. This implies that at each height, a small proportion of the illuminated area is in the sensor field.
    For photonic efficiency, mobile lighting, such as that described in patent application WO 2013/115650 A1, seems more interesting, because the lighting is in this case directional, mobile and coaxial with the detection. This arrangement ensures in principle a good energy sobriety, since it is illuminated at any moment that the neighborhood of the pixel being analyzed.
    However, in this known arrangement, the lighting is also overflowing. The beams of two lamps, focused by a single lens and returned by a polygonal mirror, give the carpet a spot of diameter close to 8 cm, much larger than the pixel. In addition, coaxial mobile lighting has a major disadvantage that limits its interest: on transparent objects, such as bags or plastic bottles, very little signal is returned to 180 ° of the lighting direction, which compromises completely the quality of the detection.
    More generally, any movable lighting assembly, based on an incoherent source such as a halogen lamp, has great difficulty in focusing the light on a reduced area, thus improving the optical balance.
    Only fiber optic assemblies achieve good light confinement, but only a few millimeters away from the scene, rendering them unusable in optical sorting. In this category, we find the SRS detection systems, or Spatially Resolved Spectroscopy.
    Among fixed lighting systems operating at a great distance from the scene, only lighting that is substantially coplanar with detection, or co-linear (coaxial), can hope to confine lighting. However, as indicated above, it is very difficult to design collinear lighting of this type, which is not based on coherent light.
    The implementation of substantially coplanar lighting and detection is disclosed by the document EP 1 243 350 and by the commercial documents of the plaintiff relating to its range of machines called "Mistral".
    In addition to the practical arrangement regarding coplanarity, the main other characteristics and the mode of operation of the machine object of the aforementioned document are indicated below.
    This known machine is intended primarily for optical sorting of various objects, including waste for recycling.
    Said objects to be sorted are spread in monolayer bulk on a conveyor belt, whose width is generally between 600 mm and 3 000 mm, and whose speed is fixed, and between 2 m / s and 5 m / s.
    One or more optical heads are placed side by side above the conveyor and inspect by successive lines all of its surface during its scrolling.
    Focused lighting defines a lighting plane whose intersection with the carpet defines a lighting line, and concentrates the majority of the radiation in a focused illumination area in the immediate vicinity of the illumination line.
    For each optical head, an oscillating mirror-type scanner sweeps a measuring point from one edge to the other of the portion of the light line corresponding to the field of view of the head. The analysis period of a line, corresponding to a cross scan, is a few milliseconds. At any moment, a single elementary measurement zone located in the vicinity of the scanned point is visualized and analyzed and the area of the area viewed during an elementary measurement is called a pixel. The number of pixels analyzed per line is adjusted according to the swept width to achieve a lateral resolution of a few millimeters, preferably 5 mm to 10 mm.
    The light received from the pixel being analyzed is returned by the scanner to a focusing element and injected into optical fibers for transmission in a spectrometer for analysis and evaluation.
    The light received from the pixel is decomposed into its constituent wavelengths in a diffraction grating spectrometer and the spectral data is used to classify the products for inspection or sorting purposes, by combining the material and color information extracted from the recovered signal.
    To do this, two sets of optical fibers, which bring the information to be processed and derived from the signal to different analyzers, are used, namely: a set of fibers which supplies a near infrared spectrometer, to determine the chemical composition; - another set of fibers that feeds a set of sensors to determine the color through three filters corresponding to the basic colors red, green and blue (RGB system).
    Although this existing machine, substantially corresponding to the object of the document EP 1 243 350 supra, is satisfactory, there is a persistent demand for improvement of various points, namely: a reduction in lighting requirements; a better spatial stability of the analyzed zone, which guarantees the geometric quality of the reconstructed global images, as well as the control of the coverage rates of the conveyor belt forming the conveying plane; better spectral stability of the measurements despite the defects related to the manufacturing tolerances of the analysis devices, such as the spectrometers; an optimized combination of information in case of implementation of at least two separate analysis devices.
    It is an essential object of the present invention to improve a machine of the type disclosed in EP 1 243 350 in order to meet at least part of the aforementioned application. For this purpose, the subject of the invention is a machine for automatically inspecting individual objects, arranged in a substantially monolayer manner, of an integral surface product or of particulate products distributed in a substantially continuous layer, moving in flow on a conveyor plane, said machine being, on the one hand, adapted and intended to discriminate objects, products or zones of a surface product according to their chemical composition and / or their color and comprising, d. on the other hand, at least one lighting station and at least one detection station under which the flow to be inspected passes, the or each lighting station including means for applying and focusing inspection radiation, resulting from one or more incoherent (s) and broad-spectrum source (s) emitting said radiation in the direction of the conveying plane so as to define a lighting plane, the intersection of said lighting plane and the a conveying plane defining a lighting line extending transversely to the flow direction of the flow, and a transverse band-shaped focused lighting zone extending on either side of said line of light; lighting and in the conveying plane, the or each detection station including notanunent on the one hand, a detection means for periodically scanning each point of the lighting line, and constantly receiving the radiation reflected by a measurement zone element or pixel extending around the scanned current point, said moving pixel defining, during scanning of the illumination line by the detection means, a detection zone in the form of a transverse band, this zone having a dimension according to a axis perpendicular to the direction of travel, corresponding to the inspection width of the detection station, and secondly, means for collecting and transmitting the beam of multispectral radiations reflected to at least one analysis device, connected to or comprising an evaluation device, adapted and intended to carry out a processing of the signal contained in the pixel and transmitted by the collecting and transmitting means, characterized in that the focused illumination area is contained in the detection zone over the entire inspection width. The invention will be better understood, thanks to the following description, which refers to a preferred embodiment, given by way of non-limiting example, and explained with reference to the attached schematic drawings, in which:
    Figure 1 is a schematic partial view of the machine according to the invention illustrating more particularly the detection station;
    FIG. 1A is a sectional view along a plane perpendicular to the conveying plane and to the lighting plane of the object represented in FIG. 1;
    Fig. 1B is a view similar to Fig. 1A but with focus of illumination at a given distance above the conveying plane;
    FIG. 2 shows the detail of the illumination and detection zones at the conveying plane of the machine according to the invention;
    FIG. 3A illustrates a possible assembly of two spectrometers forming part of a variant of the detection station of the machine of FIG. 1, and FIG. 3B shows the optimized combination of the detection zones at the level of the conveying plane of these two spectrometers. different, according to one embodiment of the invention;
    FIG. 4A shows the consequences of the spatial instabilities of the images obtained in the case of unconfined lighting, while FIG. 4B illustrates the spatial stability of the images obtained with a machine according to the invention and that FIG. 4C shows the detailed situation of the Figure 4B;
    FIGS. 5 and 6 show the possible disturbances of the spectra because of optical imperfections of the spectrometers forming part of the detection station according to the invention, these disturbances having been greatly exaggerated for the understanding;
    The partial figures 5A and 5B illustrate the effect of an off-centering of the illuminated area in the case of unconfined lighting, while the partial figures 6A and 6B illustrate the effect of this same decentering in the context of the invention, that is to say in the case of confined lighting.
    FIGS. 1 and 1A illustrate in part a machine 1 for automatically inspecting individual objects 2, arranged in a substantially monolayer manner, of an integral surface product or of particulate products distributed in a substantially continuous layer, moving in flow F on a conveying plane 3, said machine 1 being, on the one hand, suitable and intended to discriminate objects, products or zones of a surface product according to their chemical composition and / or their color and comprising on the other hand, at least one lighting station 4 and at least one detection station 4 'under which the stream F to be inspected passes.
    This or each lighting station 4 comprises in particular means 6 for application and focusing of R inspection radiation, from one or more source (s) 5 incoherent (s) and broad spectrum, emitting said radiation R in the direction of the conveying plane 3 so as to define a lighting plane 7, the intersection of said lighting plane 7 and the conveying plane 3 defining a lighting line 8 extending transversely to the direction D of scrolling of the flow F, and a transverse band-shaped focused lighting zone ZEF, extending on either side of said illumination line 8 and in the conveying plane 3.
    The or each detection station 4 'comprises in particular: on the one hand, a detection means 9 for periodically scanning each point of the lighting line 8, and constantly receiving the radiation reflected by a measurement zone element 10 or pixel 10 extending around the scanned current point, this moving pixel defining, during the scanning of the illumination line 8 by the detection means 9, a transverse band-shaped detection zone ZD, this zone ZD having a dimension L along an axis perpendicular to the direction of travel D, corresponding to the inspection width of the detection station 4 ', and secondly, means 9, 11 for collecting and transmitting the beam 12 of multispectral radiation reflected to at least one acquisition device 13, connected to an analysis device 14, capable of processing the signal contained in the pixel 10 and transmitted by the glue means and transmission 9,11.
    According to the invention, this machine 1 is characterized in that the focused lighting zone ZEF is contained, that is to say, preferably strictly included, in the detection zone ZD over the entire width L.
    Still in accordance with the invention, it is provided that the scanning mobile pixel 10 has a determined extension in the direction D of the flow axis F, with limits and edges upstream and downstream 10 ', and in that the means 5, 6 of application and focusing are configured to achieve a confinement of the illumination such that, during the entire displacement of the moving pixel 10 on or in the vicinity of the conveying plane 3, the upstream and downstream limits or edges of the lighting zone ZEF in the direction D scrolling are always contained within the limits or edges upstream and downstream 10 'of said pixel 10 in said direction D scrolling.
    Thanks to the aforementioned provisions of the invention, which take the opposite of the overflowing lighting recommended by the state of the art, the skilled person understands that in addition to the reduction of the lighting power resulting from their implementation, it is also possible to guarantee good spatial and spectral stability of the analyzed area, as well as an easy obtaining of the agreement between several acquisition devices and analysis of the spectrometer type, as indicated hereafter more in details.
    Preferably, the two zones ZEF and ZD are both substantially centered on the lighting plane 7, and therefore with respect to the lighting line 8.
    Also in accordance with an advantageous constructive variant of the invention, resulting in the suppression of any means or material transmission medium of the beam 12 of reflected and collected radiation, such as a bundle of optical fibers implemented in the state of the technique, the shape of the scanning moving pixel 10 is determined by the shape of the sensors or the arrangement of sensors 15 forming part of said at least one acquisition and analysis device 13, 14 and / or by the shape of the opening 13 'of reflected radiation input of the device 13 comprising these sensors 15, said pixel 10 preferably having an elongated rectangular shape in the direction D of scrolling.
    In a preferred manner and in order to maintain efficient operation of the analysis device, while guaranteeing the aforementioned advantages of a confined lighting according to the invention, it is envisaged that the illuminated zone 10 'of the moving pixel 10 during its scanning movement on the along the illumination line 8, that is to say its common area with the focused illumination zone ZEF, represents less than 80% of the total area of said pixel 10, and preferably at least 30%, preferably at least At least 40% of this area, with 60% to 80% being preferred, with 70% appearing to be substantially optimal for most cases.
    In order to further optimize the performance of the machine in terms of lighting and to reduce or eliminate interference or nuisance on this aspect, the application and focusing means preferably comprise means 6 for reflection and confinement of the radiation coming from the source (s) 5, as well as means 16 for stopping the radiation emitted directly by this or these source (s) towards said conveying plane 3 and located in a given angular sector 18, of so that all the radiation R received on the conveying plane 3 passes through the focusing means 6 and ends in the focused illumination zone ZEF.
    Of course, these means 5, 6 and 16 may be unitary or modular, or partially modular and unitary.
    Depending on the nature of the inspection, the desired information and / or the products / objects 2 to be characterized, different modes of adjustment and operation of the machine 1 can be envisaged.
    Thus, in order to be able to guarantee 100% coverage of the scrolling flux F, the scanning frequency defined by the detection means 9 is adjustable so that it can be adjusted to the speed of movement of the stream F so that during the scanning of two successive lines, the confined lighting zones ZEF of each of these lines illuminate on the conveying plane 3 scrolling portions in the form of transverse strips exactly contiguous in the direction D scrolling, so as to analyze at least once all point of the flow F scrolling.
    For an inspection opening different from 100%, namely less than or greater than this value, the scanning frequency defined by the detection means 9 is adjustable so that it can be adjusted to the running speed of the stream F so that, during the scanning of two successive lines, the confined lighting zones ZEF of each of these lines illuminate on the conveying plane 3 in scrolling of the surfaces in the form of transverse strips which are either separated by a fixed and controlled distance, or exhibit a recovery over a distance or with a fixed and controlled rate.
    According to a preferred constructive variant of the machine 1, the detection means 9 and the collecting and transmission means 9, 11 are part of the same optical arrangement corresponding to a detection station 4 'and comprising, on the one hand, , a scanner mirror 9 and at least one focusing element 11 and configured, on the other hand, to collect and transmit the image present in the pixel 10 to at least one acquisition and analysis device 13, 14, advantageously to through an inlet opening 13 'in the form of a rectangular slot.
    FIG. 1 represents only a part or a module of the single lighting station 4 providing a confined lighting zone ZEF preferably over the entire width of the conveying plane 3. When several lighting modules are provided, these are of course aligned with each other with abutment in a direction perpendicular to D.
    Similarly, FIG. 1 shows, for simplicity, only one detection station 4 'on the two stations that the machine 1 partially represented in this figure 1 represents. The second station 4', not shown but identical to that shown, has a detection zone aligned abutting with the 2D area shown and extending over the remaining transverse portion of the conveying plane 3. Of course, the two detection stations 4 'are aligned on the lighting station 4, or vice versa.
    Advantageously, the scanner mirror 9 is a rotating multifaceted polygonal mirror, the rotation speed of which is advantageously adjustable, the focusing element 11 possibly being of refractive type, such as a lens, or of reflective type, such as a parabolic mirror. off axis.
    Although the machine 1 may possibly comprise only an acquisition device 13 (possibly one per inspection station 4) for the or each beam 12 (FIG. 1), the machine 1 preferably comprises at least two acquisition devices 13 distinct, advantageously of different types, such as a spectrometer of NIR type for the analysis of near-infrared radiation and a spectrometer of VIS type for the analysis of visible radiation, an optical means 17 for subdividing the light beam 12 of the radiation reflected, forming the image contained in the scanning moving pixel 10 (the latter defining the useful portion of said beam 12), into a plurality of secondary beams each directed towards one of the acquisition devices 13, for example of the dichroic filter type (FIG. 3A) .
    While the machine 1 has only one lighting station 4, possibly with a modular structure, it is obvious that the machine 1 may comprise a single detection station 4 'or more such stations, whose inspection widths L 'additive.
    In the latter case, the detection means 9, the collection and transmission means 9, 11 and the said at least one acquisition device 13 and possibly analysis device 14 can be grouped together in a structural and functional unit forming a head of modular detection and corresponding to a detection station 4 '.
    In addition, in case of plurality of detection stations 4 ', each may comprise two different spectrometers 13.
    In order to optimize the illumination to promote detection and as shown in FIG. 1B, the application and focusing means 5, 6 of the radiation R in the form of confined lighting according to the invention can be arranged, configured and dimensioned. in such a way that the line of focus of the incident incident radiation R, part of the illumination plane 7, is situated at a determined distance H above the conveying plane 3, this distance possibly being able to be a function of the average size of the objects 2 to inspect or the thickness of the product layer (s) scroll (s).
    It will be noted that the projection in the direction of the detection plane on the conveying plane 3 of this focusing line corresponds normally to the lighting line 8. The subject of the invention is also a method of automatic inspection of individual objects. 2, arranged in a substantially monolayer manner, of an integral surface product or of particulate products distributed in a substantially continuous layer, moving in flow F on a conveying plane 3, said process being suitable and intended to discriminate objects, products or areas of a surface product according to their chemical composition and / or their color and implementing at least one lighting station 4 and at least one detection station 4 'under which passes the flow F to inspect.
    This method essentially consists in: transmitting, via means 6 of application and focusing, inspection R-radiation, originating from one or more incoherent (s) source (s) and broad spectrum, this in the direction of the conveying plane 3 so as to define a lighting plane 7, the intersection of said lighting plane 7 and the conveying plane 3 defining a lighting line 8 extending transversely to the direction D of scrolling of the stream F, and creating a transverse band-shaped focused lighting zone ZEF, extending on either side of said illumination line 8 and in the conveying plane 3, to be scanned, with a means 9 periodically detecting each point of the illumination line 8, and continuously recovering the radiation reflected by an elementary measurement zone or pixel 10 extending around the scanned current point, this moving pixel defining, during the sweep of the l 8 by the detection means 9, a detection zone ZD in the form of a transverse strip, this zone ZD having a dimension L along an axis perpendicular to the direction of travel D, corresponding to the inspection width, to collecting the beam 12 of reflected multispectral radiation and transmitting it to at least one acquisition device 13, connected to an analysis device 14, by means 9, 11 adapted, and to perform sequentially and repeatedly a treatment of the signal contained in the pixel 10 and transmitted by the collecting and transmitting means 9, 11, the various means 5, 6, 9, 11, 13, 14 all forming part of at least one detection station 4 'or at least one lighting station 4 respectively.
    This method is characterized in that, during the course of the various operational steps mentioned above, the focused illumination zone ZEF is contained in the detection zone ZD over the entire inspection width L.
    Preferably, the aforementioned method implements a machine 1 as described above and detailed below.
    A more detailed description of the constitution and operation of a possible alternative embodiment of the machine 1 according to the invention and the advantages that it has is explained below, in relation to FIGS. 1, 1A and 2 to 6. .
    Referring first to FIGS. 1 and 1A, it is noted that the machine 1 comprises at least one thermal and multispectral light source 5, for example a tube containing a tungsten-halogen filament, which provides a broad-spectrum light in visible and near infrared domains. A reflector 6 associated with the source 5 focuses all the rays that reach it to a lighting line 8 located on the conveying plane 3 formed by a conveyor belt. As in EP 1 243 350, the shape of the reflector 6 is cylindro-elliptical, the filament of the tube 5 is placed at one of the centers of the ellipse and creates at the opposite focus an enlarged image of this filament. This other focus is located in the vicinity of the carpet 3. This image defines in the vicinity of the line 8 a focused lighting zone ZEF. The zone ZEE is enlarged by the magnification provided, for example of the order of 10 to 25, preferably of the order of 15 to 20. If for example this filament has a diameter of 1 mm and the magnification is 18, the The height of the zone ZEE will be 18 mm (we speak of height for the pixels and images in top view, that is to say of their dimension in the direction D of scrolling objects 2).
    It is the spectral signals contained in these elementary images successively processed which contain the information useful for the discrimination of the products or objects.
    This height is maintained over the entire inspection width L, because there is no defocus on the transverse axis of the carpet. Both the optical theory and the measurements performed by the inventors confirm that the illumination intensity is substantially homogeneous throughout the ZEF zone and that it collapses suddenly at the high or low edge of said ZEF zone (upstream and downstream limits of this area in the direction D scrolling carpet 3 objects 2).
    Of course, the application and focusing means may have a modular constitution with several sets [tube 5 + reflector 6] aligned in the transverse direction of the belt 3.
    In practice, it is also necessary to take into consideration the residual lighting that does not pass through the reflector 6, that is to say direct lighting, whose illumination intensity is about 100 times more low on the belt 3 in the vicinity of the zone ZEF. It is possible to mask this residual illumination by a mask or a stop piece 16 located in the vicinity of the halogen tube 5, or even on the tube itself. The removal of the residual illumination results in concentrating all of the radiation R reaching the carpet 3 in the zone ZEF.
    The detection system is, if not structurally at least optically, centered on the illumination line 8. At all times, the light beam 12 coming from an elementary zone 10, called a pixel and situated in the zone ZEF, in which it moves according to the scanning movement of the means 9, for example a scanner mirror, is picked up and redirected by said means 9. The rotary movement of the scanner 9 makes it possible to scan at the pixel 10 a wide detection field ZD extending in 3. The scanner 9 may be of the oscillating mirror or polygonal mirror type.
    The beam 12 deflected by the scanner 9 is focused by a focusing element 11 towards the entrance slit 13 'of at least one spectrometer 13. Inside the spectrometer 13, the light is sent onto a diffraction grating 13 " and distributed according to its spectral composition on a strip 15 'comprising a plurality of photodiode type sensors 15. These sensors 15 may be regularly spaced or not inside the strip 15' The signal received by each sensor 15 is amplified and then digitized by suitable electronics (not shown) The spectrum constituted by the set of responses of the sensors 15 is analyzed in real time by a computing device 14 which makes it possible to classify the surface contained in the pixel 10 in a family of products or objects 2 to sort.
    The optional subsequent steps include aggregation processing and global image formation which group together the elementary images of the contiguous pixels acquired during successive crosswise scans to define homogeneous object representations, whose surface and size can be determined. form, and that one can choose to eject, select, categorize or not. Finally, in the case where the detection station (s) 4 'is (are) part of a sorting machine 1, ejection instructions are sent to a bar of solenoid valves with compressed air (forming part of of the machine but not shown), located at the end of the conveyor 3, and thus make it possible to divert the object 2 considered from its natural fall path, either upwards or downwards, in a suitable container.
    To lighten FIGS. 1 and 1A, the possible subdivision of the light beam 12 into two components NIR (near infrared) and VIS (visible), performed by a dichroic mirror upstream of the spectrometers, has not been shown either. The spectrometer 13 shown can therefore be a NIR spectrometer or a VIS spectrometer. One possible embodiment of such a subdivision by means of a dichroic filter is shown in FIG. 3A. This figure illustrates the separation of the luminous flux in its component NIR (through) and its component VIS (reflected). Each secondary light flux is focused, due to a suitable arrangement of the means 11 and 17, to pass through the specific input slots 13 'of each spectrometer 13. At any time during an inspection process, the pixel 10 is the common image of all the sensors 15 on the belt 3. The set of successive positions of the moving pixel 10 during a scanning cycle of the transverse illumination line 8 constitutes the detection zone ZD. With an optical magnification of about 20 for the NIR and sensors of 1 mm in height, the height (or width) of the detection zone ZD is therefore 20 mm, at least where the elementary image recovered. is clear. Where the image is blurred, the height is larger, for example up to 23 mm on the sides of the field of view. For a VIS pixel with a larger sensor, for example 1.5 mm, the height of the ZD zone is 20 x 1.5 = 30 mm for a sharp image, and up to 35 mm for the edges of the field.
    According to the invention, the illumination is confined, that is to say that the zone ZEF is entirely comprised in the detection zone ZD, which implies that the height of the zone ZEF, which is constant in this mode of realization, is lower than that of the zone ZD. The height of the zone ZD is variable because the focusing of the moving pixel can be perfect only for a given distance, and the distance from the scanner 9 to the conveying plane 3 is variable.
    In the case of a strip of multi-line sensors, the strip 15 'may have several lines of parallel sensors, for example two or four lines, they may be considered as a single line, the height of which is greater. According to the invention, the lighting is, in this case, confined so that the total height of the different superimposed sensor lines is greater than that of the zone ZEF.
    The above definition is strictly applicable only in areas where the light is focused, whether for illumination or for the image of the sensors 15. This condition is verified exactly for a single distance, while it is intended to detect objects and products 2 having a certain height (height) above the carpet 3. The lighting remains confined only near the carpet 3, because the lighting beam (incident R radiation) is much more open than the detection beam 12. In the context of a practical embodiment of the invention as shown, we can have total opening angles of 20 ° to 30 ° for the illumination beam R, against less than 3 ° for the detection beam 12 . The condition can therefore be respected substantially only up to a few centimeters from the focal length, typically 50 mm. Nevertheless, this height is sufficient for the passage of almost all of a flow F, especially if the incident R radiation is focused 10 mm to 20 mm above the belt 3, that is to say at the height of passage of the majority of objects or products 2.
    In order to comply with the confined lighting condition according to the invention, practical measures must be taken to comply with adjustment and operating tolerances.
    By a prior alignment procedure, the ZEF lighting zones of the different transversely aligned reflectors 6 are first aligned, which together cover the entire inspection width L, then the detection zones ZD of the arrangement (s) ( s) optical (s) 9, 11 constituting one or more detection stations 4 '.
    For example, the tolerance on the height of the image of the filaments of the tubes 5 is well controlled, for example at +/- 2 mm. This is a setting tolerance: once set, the lighting line 8 is perfectly stable in space F (preferably to better than the millimeter).
    There is also a tolerance on the height (in the direction D) of the analyzed zone ZD, in particular when the scanner 9 is a polygonal swivel mirror: a typical value is +/- 2 mm. The setting guarantees a fluctuation in this range during operation. It is especially the change of the reflecting face of the mirror 9 which creates an inevitable periodic oscillation, especially when using faces attached to a fixed frame. There is an alternative of building the polygon mirror with a machined monobloc part, but it is an uneconomical solution.
    By controlling these tolerances and their eventual accumulation, the risk that part of the illuminated height is not in the ZD detection zone can be extremely limited or even eliminated.
    The preferred embodiment of the scanner 9 corresponds to a polygonal mirror controlled at a constant speed, with a motor controlled at the desired speed (adjustable). If for example, the mirror 9 performs 17 revolutions per second and has 10 faces, it scans 170 lines per second, or 5.9 ms per line. If the belt advances to 3 m / s, it progresses by about 18 mm in one period. The height to be analyzed (dimension of the lighting strip ZEF in the direction D - common zone with the detection band ZD) is therefore ideally at least 18 mm to have no detection hole. The speed of the mirror 9 can be adjusted to obtain the exact match (100% coverage of the moving flux).
    This preferred embodiment makes it possible to correctly manage several speeds of advance of the belt 3, without losing the coverage rate of the carpet: for example 3 m / s and 4 m / s. For 4 m / s, it suffices to turn the aforementioned mirror 9 to about 23.5 revolutions per second for an ideal coverage 100%.
    This reasoning can easily be extended to other coverage values, such as 90% (leaving a voluntarily unhedged percentage) or 120% (voluntary recovery) if the user so wishes. The previous diagram thus allows a flexible management. The confined lighting according to the invention has many advantages explained below.
    In Fig. 2, the respective positions of the zone ZEF, the detection zone ZD and the moving pixel are shown. The coincidence of the centers of these zones on the lighting line 8 is, in practice, true only on average. At any time, the ZEF zone may be slightly off-center, as shown.
    All photons emitted from the intersection of zone ZEF and pixel 10 (mobile inspection window) and directed to focusing element 11 via scanner 9 contribute to the sensed signal. This reduces the total lighting power required in significant proportions.
    Covering lighting (correspondence ZD = ZEF), or even overflowing according to the state of the art, would require taking into account the blurs at the edge of the detection field, and also the centering tolerances of the scanner mirror 9 during its rotation. To fully illuminate the image of the sensors 15 with the above assumptions, it would then be a height of 23 mm at the edge of the field, plus +/- 2 mm tolerance, or 27 mm in all.
    Thus, going from 27 mm for lighting overflowing to 18 mm for confined lighting, with the same local lighting intensity, we obtain a power gain of 33%. This same reduction applies to the risk of heating of the objects 2 or the conveying plane 3, in case of stopping the belt, the conveyor belt or the like.
    According to the invention, even with two spectrometers 13 having bars 15 'of sensors 15 of different heights, the same height is taken into account at all times, namely that which is illuminated, thus allowing an exact and natural concordance between several spectrometers. (Figure 3B).
    This situation is illustrated in FIG. 3B, showing a detection zone ZD for the NIR and a detection zone ZD 'larger for the VIS. The captured light always comes from the intersection region of the pixel 10 with the zone ZEF. However, this region or intersection zone is exactly the same for the two spectrometers, NIR and VIS. With the dimensions mentioned above, even if the image of the VIS pixel has a height of 30 mm, only 20 mm will actually be useful. Experience has shown the inventors the importance of complying with this condition for good multisensor analysis of the pixel 10, any mismatch likely to result in rejection of the pixel 10 analyzed.
    This natural correspondence avoids a very delicate alignment between the input slots 13 'of the two spectrometers 13 on the same optical assembly. These slots 13 'should have exactly the same height and the same centering if the lighting was not confined. In connection with the invention, relatively high slots 13 'can be used without compromising correspondence.
    Note that for the different cases shown in Figures 4A to 4C, the spectrometer 13 used comprises two rows of superimposed sensors 15, so as to obtain homogeneous spatial resolutions in both axes.
    With good rotational speed adjustment of the mirror mirror 9 (polygonal) multifaceted and the speed of the carpet 3, there is an exact coverage of the carpet at 100%. On the other hand, with a wide and overflowing illumination according to the state of the art, given the viewing tolerances of the mirror 9 in the scroll axis (or height), the detected area would oscillate with the passage of each face of the mirror. (typically +/- 2 mm), creating overlaps or spot holes. This situation is illustrated in FIG. 4A: three successive lines are represented, in the case where the spectrometer comprises two rows of superimposed sensors. It can be seen that the two upper sensor lines have an overlap which is moreover variable and can become important at the edge of the field, whereas the second and third lines have a gap with a detection hole, which is clearly visible in the center of the field. the field area.
    On the contrary, with limited effective detection by the zone ZEF which is fixed, this oscillation disappears (the only other source of instability related to the lighting would be a variable speed of advance of the carpet, but such rapid variations of this speed are not likely). This situation in accordance with the invention is illustrated in FIG. 4B, where the construction of the two-dimensional image by succession of the three lines is perfect (these are denoted ZEF1, ZEF2 and ZEF3).
    The consequences of off-centering the ZD areas of each line are illustrated in Figure 4C, where the three lines have been shown separately for clarity. ZEF1 is well centered with its detection zone ZD1, ZEF2 sees its detection zone ZD2 shifted upwards and ZEF3 sees instead its detection zone ZD3 shifted downwards. In all cases, the information of each pixel 10 comes from its true position on the conveyor plane 3 (belt, conveyor belt), but the relative illuminated surfaces seen by each sensor 15 vary. For example, the lower line of sensors in ZD3 receives less signal than the upper line. So the signal levels may vary, but not the positions from which the signals originate.
    This spatial stability of the analyzed zone provides many advantages mentioned below. The absence of a detection hole is the most natural goal. This can be important to look for small objects 2 that must be discarded: for example sheaths PVC electrical son during a sorting of CSR (solid fuels recovery) or non-PET flakes in a sort of plastic flake . In the absence of confined lighting, a systematic recovery with a high rate is mandatory to avoid the risk of detection holes.
    One may also wish to optimize the detection rate of the carpet to gain productivity. For example, when the smallest object sought is known to be 5 mm wide, a detection hole of 2 mm to 3 mm can be tolerated between two successive ZD lines or detection strips. The precise mastery of the succession of these lines or bands makes it possible to optimize this parameter without taking any margin.
    If, conversely, it is desired for security to have a detection overlap with a controlled redundancy rate, for example to analyze each point twice, it is possible to precisely control a recovery of half between two successive lines or bands ZD .
    The perfect stability of the two-dimensional image reconstructed by aggregation allows better image processing of objects 2. The detection of angular or rounded contours is only possible if the successive lines are evenly spaced and the pixel images are well aligned. For example, if we visualize a round object, we can easily imagine that its appearance will be distorted on the image constructed from Figure 4A. On the contrary, its shape will be well seen in Figure 4B.
    As indicated below, the use of a confined lighting according to the invention also has an influence on the spectral stability of the analyzed zone, especially when the overlap of the illumination and detection zones is not perfect. In this regard, reference can be made to FIGS. 5 and 6 which illustrate the different situations (FIG. 5: without implementation of the invention / FIG. 6: with implementation of the invention).
    The incident light is focused on the slot 13 ', then it is distributed on the grating 13 ", where it is separated according to its spectral composition and refocused on the strip 15' which contains the individual sensors 15 (not shown). separated according to N Wavelength Lines (hereinafter PLO) By way of example, the images of the slot 13 'for eight different PLOs denoted λ1 to λ8 are represented by way of example.
    The optical magnification of the system being one, the image of the slot 13 'for a PLO is a rectangle of the same dimensions as the slot 13', in the case of perfect optics.
    For a good efficiency of the spectrometer 13, the slot 13 'must not diaphragm the image of the sensors 15, and it must be at least as high as the sensors 15. Assuming that it is the case, the part illuminated on the bar 15 'then depends only on the portion illuminated on the entrance slot 13', and this illuminated portion is a part of the image of the zone ZEF at the level of the carpet 3, which may be designated as " illuminated slot ". It can move during the rotation of the polygon formed by the swivel scanner mirror 9, or in case of disruption of the reflector 6. It is shown in Figures 5 and 6 that the illuminated portion of the slot 13 '.
    Like any physical assembly, a spectrometer 13 has imperfections of origin, initial setting or related to aging or resulting from the conditions of use. There may be mentioned in particular two, shown in Figures 5 and 6.
    Due to an imperfect focus, the image of the illuminated slot for a PLO may have a blur, and therefore be enlarged and overflow the bar 15 '. This case is represented for λ1, λ7, and λ8.
    The strip 15 'of sensors 15 is not perfectly parallel to the output band: PLO images are therefore higher at one end of the strip than at the other, and the corresponding sensors may not be completely illuminated. FIGS. 6 and 7 show a rise from left to right of the image of the PLO images with respect to the bar 15 '.
    The consequences of this type of imperfections on the stability of the spectra are given below. What characterizes a spectrum in the context of the invention are not the absolute values of the luminances, but fixed relative proportions between the different PLOs. Therefore, there will be spectrum disturbance whenever the response of a PLO is changed in different proportions from other PLOs.
    If the image of the illuminated slot protrudes from a sensor 15, without overflowing other sensors 15 in the same proportions, the spectral composition analyzed is affected. This is the case in FIG. 5. If we compare a situation centered on FIG. 5A with an off-center situation in FIG. 5B, we see that the responses λ4 and λ5 are not affected, that λ6, λ7, and λ8 their signal increase, while the signals of λ1, λ2, and λ3 decrease.
    On the contrary, if the lighting is well confined in accordance with the invention, that is to say that the image of the slot illuminated on each sensor 15 does not reach the top or bottom edges of said sensor 15, all the expected photons are captured. It can be seen in FIG. 6 that the responses are not affected between situations 6A and 6B, despite a decentering identical to that shown in FIG. 5.
    It is clear that the confined lighting avoids affecting the spectral composition, provided that it is confined in the central part of each sensor 15, and with sufficient margins.
    These margins can be advantageously adjusted in such a way that, while retaining a guarantee of achieving the aforementioned stability conditions and compensation for manufacturing, construction and / or assembly imperfections, the inspection zone (intersection of ZEL and ZD) is not too restricted in height to avoid a decrease in the quantitative and qualitative performance of the machine 1.
    Consequently, the prediction according to the invention of a line or zone of illumination ZEF substantially narrower than the line or zone of detection ZD constitutes the most stable configuration for managing the imperfections due to manufacturing tolerances and imperfections of the spectrometer. 13 used for spectral analysis in the context of the machine 1.
    Of course, the invention is not limited to the embodiments described and shown in the accompanying drawings. Modifications are possible, particularly from the point of view of the constitution of the various elements or by substitution of technical equivalents, without departing from the scope of protection of the invention.
    权利要求:
    Claims (14)
    [1" id="c-fr-0001]
    Machine (1) for the automatic inspection of individual objects (2), arranged substantially monolayerly, of an integral surface product or of particulate products distributed in a substantially continuous layer, moving in flow (F ) on a conveying plane (3), said machine (1) being, on the one hand, adapted and intended to discriminate objects, products or zones of a surface product according to their chemical composition and / or their color and comprising, on the other hand, at least one lighting station (4) and at least one detection station (4 ') under which the flow (F) to be inspected passes, the or each lighting station (4) ) including means (6) for application and focusing of radiation (R) inspection, from one or more source (s) (5) incoherent (s) and broad-spectrum, emitting said radiation ( R) in the direction of the conveying plane (3) so as to define a lighting plane (7), the intersection of said plane n lighting (7) and the conveying plane (3) defining a lighting line (8) extending transversely to the flow direction (D) of the flow (F), and a lighting zone transverse strip-shaped focusing device (ZEF) extending on either side of said illumination line (8) and in the conveying plane (3), the or each detection station (4 ') including notaunent on the one hand, a detection means (9) for periodically scanning each point of the illumination line (8), and continuously receiving the radiation reflected by an elementary measurement area or pixel (10) extending around of the scanned current point, this moving pixel (10) defining, during the scanning of the illumination line (8) by the detection means (9), a detection zone (ZD) in the form of a transverse band, this zone (ZD) having a dimension (F) along an axis perpendicular to the direction (D) of scrolling, corresponding to the width r inspection of the detection station (4 '), and secondly, means (9, 11) for collecting and transmitting the beam (12) of multispectral radiation reflected on at least one acquisition device (13). ), connected to an analyzing device (14), suitable for processing the signal contained in the pixel (10) and transmitted by the collecting and transmitting means (9, 11), machine (1) characterized in that the focused illumination area (ZEF) is contained in the detection zone (ZD) over the entire width (L).
    [2" id="c-fr-0002]
    2. Machine according to claim 1, characterized in that the scanning mobile pixel (10) has a determined extension in the direction (D) of the flow of the flow axis (F), with limits or edges upstream and downstream ( 10 '), and in that the means (5, 6) for applying and focusing are configured to provide a confinement of the illumination such that during the entire movement of the moving pixel (10) on or in the vicinity of the plane 3), the upstream and downstream limits or edges of the lighting zone (ZFF) in the direction (D) of travel are always contained within the upstream and downstream limits or edges (10). ') of said pixel (10) in said scrolling direction (D).
    [3" id="c-fr-0003]
    Machine according to claim 1 or 2, characterized in that the shape of the sweeping moving pixel (10) is determined by the shape of the sensors or the arrangement of sensors (15) forming part of said at least one device (13, 14) of acquisition and analysis and / or by the shape of the opening (13 ') of admission of reflected radiation of the device (13) comprising these sensors (15), said pixel (10) preferably having a shape rectangular elongated in the direction (D) of scrolling.
    [4" id="c-fr-0004]
    4. Machine according to any one of claims 1 to 3, characterized in that the illuminated area (10 ") of the moving pixel (10) during its scanning movement along the lighting line (8), c ' that is to say its common surface with the focused illumination area (ZFF), represents less than 80% of the total area of said pixel (10), and preferably at least 30%, preferably at least 40%, of this area .
    [5" id="c-fr-0005]
    5. Machine according to any one of claims 1 to 4, characterized in that the application and focusing means comprise means (6) for reflection and confinement of radiation from the source (s) (5). ), and means (16) for stopping the radiation emitted directly by this or these source (s) to said conveying plane (3) and located in a given angular sector (18), so that all the radiation (R) received on the conveying plane (3) passes through the focusing means (6) and ends in the focused illumination area (ZFF).
    [6" id="c-fr-0006]
    6. Machine according to any one of claims 1 to 5, characterized in that the scanning frequency defined by the means (9) of detection is adjustable to be adjusted to the flow rate of the flow (F) in such a way that, during the scanning of two successive lines, the confined lighting zones (ZEF) of each of these lines illuminate on the conveying plane (3) in scrolling portions in the form of transverse strips exactly contiguous in the direction (D) scrolling, so as to analyze at least once every point of the flow (F) scrolling.
    [7" id="c-fr-0007]
    7. Machine according to any one of claims 1 to 5, characterized in that the scanning frequency defined by the means (9) of detection is adjustable to be adjusted to the flow rate of the flow (F) in such a way during the scanning of two successive lines, the confined lighting zones (ZEF) of each of these lines illuminate on the conveying plane (3) in scrolling of the surfaces in the form of transverse strips which are either separated by a fixed distance and controlled, either have a recovery over a distance or with a fixed and controlled rate (e).
    [8" id="c-fr-0008]
    8. Machine according to any one of claims 1 to 7, characterized in that the detection means (9) and the means (9, 11) of collection and transmission are part of the same optical arrangement corresponding to a position detecting means (4 ') and comprising, on the one hand, a scanner mirror (9) and at least one focusing element (11) and configured, on the other hand, for collecting and transmitting the image present in the pixel (10). ) at least one acquisition and analysis device (13, 14), advantageously through an inlet opening (13 ') in the form of a rectangular slot.
    [9" id="c-fr-0009]
    9. Machine according to claim 8, characterized in that the scanner mirror (9) is a rotational multifaceted polygonal mirror, whose rotational speed is adjustable, the focusing element (11) can be refractive type, such as a lens, or reflective type, such as an off-axis parabolic mirror.
    [10" id="c-fr-0010]
    10. Machine according to any one of claims 1 to 9, characterized in that it comprises at least two distinct acquisition devices (13), advantageously of different types, such as a spectrometer of NIR type for analysis near-infrared radiation and a VIS-type spectrometer for the analysis of visible radiation, optical means (17) for subdividing the light beam (12) of the reflected radiation forming the image contained in the moving pixel (10) into several secondary beams each directed to one of the acquisition devices (13), for example of the dichroic filter type.
    [11" id="c-fr-0011]
    11. Machine according to any one of claims 1 to 10, characterized in that the detection means (9), the means (9, 11) of collection and transmission and said at least one acquisition device (13) and analysis (14) are grouped into a structural and functional unit forming a modular detection head and corresponding to a detection station (4 ').
    [12" id="c-fr-0012]
    12. Machine according to any one of claims 1 to 11, characterized in that the line of focus of the incident confined radiation (R), forming part of the lighting plan (7), is located at a distance (H) determined above the conveying plane (3), this distance may notanemment be a function of the average size of the objects (2) to inspect or the thickness of the product layer (s) scroll (s).
    [13" id="c-fr-0013]
    13. A method of automatically inspecting individual objects (2), arranged substantially monolayerly, of an integral surface product or particulate products distributed in a substantially continuous layer, flowing in flow (F) on a conveying plane (3), said method being adapted and intended to discriminate objects, products or zones of a surface product according to their chemical composition and / or their color and implementing at least one lighting station (4) and at least one detection station (4 ') under which the flow (F) to be inspected passes, said method consisting essentially of: transmitting, via means (6) of application and focusing, inspection (R) radiation from one or more (5) incoherent (s) and broad spectrum source (s) in the direction of the conveying plane (3) so as to define a lighting plan (7), the intersection of said lighting plane (7) and the plane of conveying means (3) defining a lighting line (8) extending transversely to the flow direction (D) of the flow (F), and creating a transverse strip-shaped focused illumination zone (ZEF); extending on either side of said illumination line (8) and in the conveying plane (3), to scan, with a means (9) of detection, periodically each point of the lighting line (8) , and continuously recovering the reflected radiation by an elementary or pixel measuring zone (10) extending around the scanned current point, said moving pixel (10) defining during scanning of the illumination line (8) by the detection means (9), a detection zone (ZD) in the form of a transverse band, this zone (ZD) having a dimension (L) along an axis perpendicular to the direction (D) of movement, corresponding to the width of inspection, to collect the beam (12) of reflected multispectral radiations and the transme at least one acquisition device (13), connected to an analysis device (14), by means (9, 11) adapted, and to perform sequentially and repeatedly a signal processing contained in the pixel (10) and transmitted by the collecting and transmitting means (9, 11), the various means (5, 6, 9, 11, 13, 14) all being part of at least one lighting station (4). ) or at least one detection station (4 '), characterized in that, during the course of the various operational steps mentioned above, the focused illumination zone (ZEF) is contained in the detection zone (ZD) on the entire inspection width (L).
    [14" id="c-fr-0014]
    14. The method of claim 13, characterized in that it implements a machine (1) according to any one of claims 1 to 12.
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    同族专利:
    公开号 | 公开日
    FR3048369B1|2018-03-02|
    JP2019508696A|2019-03-28|
    US20190047024A1|2019-02-14|
    EP3423202A1|2019-01-09|
    ES2788187T3|2020-10-20|
    CN108778532B|2021-01-12|
    KR20180119639A|2018-11-02|
    CN108778532A|2018-11-09|
    EP3423202B1|2020-02-26|
    CA3013444A1|2017-09-08|
    US11084063B2|2021-08-10|
    WO2017149230A1|2017-09-08|
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    法律状态:
    2017-02-21| PLFP| Fee payment|Year of fee payment: 2 |
    2017-09-08| PLSC| Publication of the preliminary search report|Effective date: 20170908 |
    2018-02-16| PLFP| Fee payment|Year of fee payment: 3 |
    2020-03-06| PLFP| Fee payment|Year of fee payment: 5 |
    2021-12-10| ST| Notification of lapse|Effective date: 20211105 |
    优先权:
    申请号 | 申请日 | 专利标题
    FR1651728|2016-03-01|
    FR1651728A|FR3048369B1|2016-03-01|2016-03-01|MACHINE AND METHOD FOR INSPECTING FLOWING OBJECTS|FR1651728A| FR3048369B1|2016-03-01|2016-03-01|MACHINE AND METHOD FOR INSPECTING FLOWING OBJECTS|
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